【新訊息公佈】ETS Magnetic Active Compensation System for Electron Microscopy
ETS-LINDGREN
Magnetic Active Compensation System for Electron Microscopy
Features:
*Uniform protection from environmental AC/DC magnetic interference over a wide frequency range
*Patented wideband negative-feedback design provides electronic magnetic compensation without the need for continuous re-calibration
*Offers protection against fluctuations in magnetic fields caused by subways, electrical distribution equipment, elevators and moving vehicles
*Can be applied to existing or new installations
Description
The ETS-Lindgren™ Magnetic Active Compensation System (MACS™) provides cost-effective, maintenance-free environmental magnetic field shielding solutions for high-resolution EM (Electron Microscope) instrumentation. They are the highest-performance commercial active magnetic field compensation equipment available for protecting sensitive EM instruments from AC/DC environmental magnetic field fluctuation. These reliable systems provide real time compensation of environmental magnetic field fluctuations caused by moving vehicles, trains, elevators, electrical distribution equipment, and other sources.
ETS-Lindgren’s MAC systems provide a uniform solution, at DC and through low frequency, using a highly sophisticated electronic magnetic compensation technology. Utilizing a patented wideband negative-feedback electronic design, the equipment deeply attenuates interferingmagnetic fields at a fraction of the cost of alternative methods, such as passive shielding or equipment relocation. Field attenuation at the protected EM exceeds a factor of 30. This permits the successful operation of EMs- especially units with highly susceptible FEG emitters- at virtually any site.
2016-09-20
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