Other Optical Instruments

Optical Delay Line

Optical Delay Line

產品描述:

features

The ADL-200 features an industry-leading delay tunability of up to 2.5ns. It comes in a benchtop model with a VFD screen, and allows easy control of the delay settings.

With low insertion-loss and low loss-variation, good repeatability and delay resolution, the ADL-100 is suitable for the majority of delay-line applications

  • Variable delay ~ 2.5ns
  • Low-loss and low loss-variation
  • Simple control via front panel
  • VFD screen for wide-angle viewing
  • USB/GPIB interface

applications

  • Optical communication
  • Coherent communication
  • Optical fiber sensing
  • Pulse characterization

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Polarization Controller, Polarizer, Variable Attenuator

Polarization Controller, Polarizer, Variable Attenuator

產品描述:

features

The MLC Series allows flexible control of lightwaves by combining high-quality polarizer, half- and quarter- wavelplates, and variable attenuator cartridges.

The MLC Series is primarily used for high-precision polarization control with either a dual-waveplate or a three-waveplate combination. The waveplate cartridges can be controlled precisely with the angle marker clearly indicated. This allows the polarization state to be controlled easily, repeatably without any polarization drift.

  • Cartridge-type modular design
  • High-precision wave plates for polarization control
  • Polarizer, wave plates, variable attenuator cartridges
  • Low insertion and return losses

applications

  • Polarization and intensity control

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Silicon Wafer Thickness Sensor

Silicon Wafer Thickness Sensor

產品描述:

features

The SIT-200 uses a high-speed swept tunable laser, as opposed to a broadband source, to probe the wafer under test. This enables higher-power measurement per wavelength, leading to high dynamic range. As a result, thickness measurements can be performed even on un-polished wafers, for example during/after wet-etching.

  • All-Optical, non-contact thickness sensor for silicon wafers
  • High dynamic range capable of measuring disordered surfaces
  • Capable of in-situ measurement during wet-etching

applications

  • Silicon Wafer Thickness Measurement

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